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Emerging Nanotechnologies: Test, Defect Tolerance, and Reliability - Frontiers in Electronic Testing Mohammad Tehranipoor 2008 edition
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Emerging Nanotechnologies: Test, Defect Tolerance, and Reliability - Frontiers in Electronic Testing
Mohammad Tehranipoor
Emerging Nanotechnologies: Test, Defect Tolerance and Reliability covers various technologies that have been developing over the last decades such as chemically assembled electronic nanotechnology, Quantum-dot Cellular Automata (QCA), and nanowires and carbon nanotubes.
424 pages, 1, black & white illustrations
| Media | Books Hardcover Book (Book with hard spine and cover) |
| Released | December 10, 2007 |
| ISBN13 | 9780387747460 |
| Publishers | Springer-Verlag New York Inc. |
| Pages | 408 |
| Dimensions | 155 × 235 × 23 mm · 811 g |
| Language | English |
| Editor | Tehranipoor, Mohammad |
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