Radiation-induced Soft Error: A Chip-level Modeling - Foundations and Trends (R) in Electronic Design Automation - Norbert Seifert - Books - now publishers Inc - 9781601983947 - November 27, 2010
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Norbert Seifert
Radiation-induced Soft Error: A Chip-level Modeling - Foundations and Trends (R) in Electronic Design Automation

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A simulation-based methodology of chip-level radiation-induced soft error rates that is fast and reasonably accurate is crucial to the reliability and success of a final product. This book summarises selected publications that are deemed relevant by the author to enable a truly chip-level radiation-induced soft error rate estimation methodology.

136 pages

Media Books     Paperback Book   (Book with soft cover and glued back)
Released November 27, 2010
ISBN13 9781601983947
Publishers now publishers Inc
Pages 136
Dimensions 157 × 234 × 8 mm   ·   199 g
Language English  

See all of Norbert Seifert ( e.g. Paperback Book )