Electrical Atomic Force Microscopy for Nanoelectronics - NanoScience and Technology - - Books - Springer Nature Switzerland AG - 9783030156145 - August 25, 2020
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Electrical Atomic Force Microscopy for Nanoelectronics - NanoScience and Technology 2019 edition

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The tremendous impact of electronic devices on our lives is the result of continuous improvements of the billions of nanoelectronic components inside integrated circuits (ICs). This book reviews the latest progress in IC devices, with emphasis on the impact of electrical atomic force microscopy (AFM) techniques for their development.

408 pages, 60 Tables, color; 230 Illustrations, color; 26 Illustrations, black and white; XX, 408 p.

Media Books     Paperback Book   (Book with soft cover and glued back)
Released August 25, 2020
ISBN13 9783030156145
Publishers Springer Nature Switzerland AG
Pages 408
Dimensions 150 × 220 × 10 mm   ·   652 g
Language German  
Editor Celano, Umberto

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