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Residual Stress Measurement by X-Ray Diffraction
SAE International
Residual Stress Measurement by X-Ray Diffraction
SAE International
This editorial review of J784a is based upon decades of experience in the practical application of x-ray diffraction residual stress measurement methods in thousands of individual applications. J784 is a classic document. It serves as the only recognized standard for residual stress measurement available.
96 pages
Media | Books Paperback Book (Book with soft cover and glued back) |
Released | February 28, 2003 |
ISBN13 | 9780768010695 |
Publishers | SAE International |
Pages | 96 |
Dimensions | 197 g (Weight (estimated)) |
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