MOS Interface Physics, Process and Characterization - Shengkai Wang - Books - Taylor & Francis Ltd - 9781032106274 - October 12, 2021
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Shengkai Wang
MOS Interface Physics, Process and Characterization 1st edition

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The electronic device based on Metal Oxide Semiconductor (MOS) structure is the most important component of a large-scale integrated circuit and the key to achieving high performance devices. This book contains experimental examples focusing on MOS and will be a reference for academics and postgraduates in the field of microelectronics.

200 pages, 97 Line drawings, black and white; 26 Halftones, black and white; 1 Tables, black and whi

Media Books     Hardcover Book   (Book with hard spine and cover)
Released October 12, 2021
ISBN13 9781032106274
Publishers Taylor & Francis Ltd
Pages 162
Dimensions 235 × 157 × 17 mm   ·   390 g
Language English  

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