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Scanning Electron Microscopy and X Ray Microanalysis 3rd ed. 2003. Softcover reprint of the original 3r edition
Joseph Goldstein
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Scanning Electron Microscopy and X Ray Microanalysis 3rd ed. 2003. Softcover reprint of the original 3r edition
Joseph Goldstein
This text provides students as well as practitioners with a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis. Topics discussed include user-controlled functions of scanning electron microscopes and x-ray spectrometers and the use of x-rays for qualitative and quantitative analysis.
709 pages, biography
| Media | Books Book |
| Released | May 31, 2013 |
| ISBN13 | 9781461349693 |
| Publishers | Springer-Verlag New York Inc. |
| Pages | 689 |
| Dimensions | 255 × 182 × 43 mm · 1.22 kg |
| Language | English |
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