Aberration-corrected Imaging In Transmission Electron Microscopy: An Introduction (2nd Edition) - Erni, Rolf (Swiss Federal Labs For Materials Science & Technology (Empa), Switzerland) - Books - Imperial College Press - 9781783265282 - May 18, 2015
In case cover and title do not match, the title is correct

Aberration-corrected Imaging In Transmission Electron Microscopy: An Introduction (2nd Edition) 2nd edition

Erni, Rolf (Swiss Federal Labs For Materials Science & Technology (Empa), Switzerland)

Price
S$ 163

Ordered from remote warehouse

Expected delivery Dec 4 - 17
Christmas presents can be returned until 31 January

Our customers say:

14-day return policy in accordance with European consumer protection law
Top ranking on Trustpilot
Add to your iMusic wish list

Aberration-corrected Imaging In Transmission Electron Microscopy: An Introduction (2nd Edition) 2nd edition

Aberration-Corrected Imaging in Transmission Electron Microscopy provides an introduction to aberration-corrected atomic-resolution electron microscopy imaging in materials and physical sciences.

350 pages

Media Books     Hardcover Book   (Book with hard spine and cover)
Released May 18, 2015
ISBN13 9781783265282
Publishers Imperial College Press
Pages 432
Dimensions 160 × 238 × 23 mm   ·   802 g
Language English  

See all of Erni, Rolf (Swiss Federal Labs For Materials Science & Technology (Empa), Switzerland) ( e.g. Hardcover Book )