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Fundamentals of Electromigration-Aware Integrated Circuit Design Jens Lienig Softcover Reprint of the Original 1st 2018 edition
Fundamentals of Electromigration-Aware Integrated Circuit Design
Jens Lienig
The book provides a comprehensive overview of electromigration and its effects on the reliability of electronic circuits. A comprehensive set of options is presented for modifying the present IC design methodology to prevent electromigration.
159 pages, 95 Illustrations, color; 4 Illustrations, black and white; XIII, 159 p. 99 illus., 95 ill
| Media | Books Paperback Book (Book with soft cover and glued back) |
| Released | December 14, 2018 |
| ISBN13 | 9783030088118 |
| Publishers | Springer Nature Switzerland AG |
| Pages | 159 |
| Dimensions | 150 × 220 × 10 mm · 226 g |
| Language | German |
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