Applied Scanning Probe Methods II: Scanning Probe Microscopy Techniques - NanoScience and Technology - - Books - Springer-Verlag Berlin and Heidelberg Gm - 9783540262428 - February 21, 2006
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Applied Scanning Probe Methods II: Scanning Probe Microscopy Techniques - NanoScience and Technology

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These were quickly followed by the M- netic Force Microscope, MFM, and the Electrostatic Force Microscope, EFM. There are signi?cant differences between the Scanning Probe Microscopes or SPM, and others such as the Scanning Electron Microscope or SEM.

464 pages, 263 black & white illustrations, 7 colour illustrations, 17 black & white tables

Media Books     Hardcover Book   (Book with hard spine and cover)
Released February 21, 2006
Original release date 2005
ISBN13 9783540262428
Publishers Springer-Verlag Berlin and Heidelberg Gm
Pages 420
Dimensions 155 × 235 × 22 mm   ·   771 g
Language German  
Editor Bhushan, Bharat
Editor Fuchs, Harald

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