Applied Scanning Probe Methods II: Scanning Probe Microscopy Techniques - NanoScience and Technology - - Books - Springer-Verlag Berlin and Heidelberg Gm - 9783642065699 - February 12, 2010
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Applied Scanning Probe Methods II: Scanning Probe Microscopy Techniques - NanoScience and Technology Softcover reprint of hardcover 1st ed. 2006 edition

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These were quickly followed by the M- netic Force Microscope, MFM, and the Electrostatic Force Microscope, EFM. There are signi?cant differences between the Scanning Probe Microscopes or SPM, and others such as the Scanning Electron Microscope or SEM.

420 pages, 17 black & white tables, biography

Media Books     Paperback Book   (Book with soft cover and glued back)
Released February 12, 2010
ISBN13 9783642065699
Publishers Springer-Verlag Berlin and Heidelberg Gm
Pages 420
Dimensions 155 × 235 × 23 mm   ·   698 g
Language German  
Editor Bhushan, Bharat
Editor Fuchs, Harald

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